PD5高低电平检测

[ccc]

attribute((section("ram_code"))) void pmu_gpio_isr_ram(void)
{
// 读取当前GPIO状态和历史状态
uint32_t current_gpio = ool_read32(PMU_REG_GPIOD_V);
uint32_t last_gpio = ool_read32(PMU_REG_PORTD_LAST);

// 检测哪些引脚发生了变化
uint32_t changed_pins = current_gpio ^ last_gpio;

// 检查PD5（第5位）是否发生变化
if (changed_pins & (1 << 5)) {
    // 获取PD5当前状态
    uint8_t pd5_current_state = (current_gpio >> 5) & 0x01;
    uint8_t pd5_last_state = (last_gpio >> 5) & 0x01;
    uint8_t fam[1]={1};
    // 检测持续高电平（电平触发模式）
    if (pd5_current_state == 1) {
        co_printf("high-level trigger\r\n");
						uart_put_data_noint(UART0,fam,1);
						gap_security_param_t param =
						{
								.mitm = false,	// dont use PIN code during bonding
								.ble_secure_conn = false,	//not enable security encryption
								.io_cap = GAP_IO_CAP_NO_INPUT_NO_OUTPUT, //ble device has neither output nor input ability, 
								.pair_init_mode = GAP_PAIRING_MODE_WAIT_FOR_REQ,		//need bond
								.bond_auth = true,	//need bond auth
								.password = 0,
						};
						 gap_security_param_init(&param);
						 os_timer_start(&ker_timer, 60000, 0); // 60s延迟
    }
    

}

// 更新历史记录
ool_write32(PMU_REG_PORTD_LAST, current_gpio);

}我的这个检测pd高低电平的有什么问题吗，在HA的测试板上能正常检测，但是换成HB的芯片加了按钮之后，上电就一直触发高电平事件，初始化配置是这样的

[ZR]

@ccc 要做什么功能